
3d multi-directional measurement,z49,z47,x46,y52,y46,r1,wafer plane height,semi standard-specified items (x30, x31, z30, z31, etc.)
equipped with an automatic calibration function, which ensures the accuracy of each measurement.
high precision & consistency: accuracy up to ±25μm, repeatability of multiple inspections: ±15μm
the smallest size in the industry
substrate manufacturing, wafer manufacturing, advanced packaging/foup、fosb