
enables immediate transfer to cleaning after lapping, preventing dried grinding slurry residue
fully synchronized with lapping process cycle
combines immersion ultrasonic cleaning, horizontal roller brush scrubbing, dual-fluid spray rinsing, and high-pressure air knife drying for rapid post-lapping wafer surface cleaning
space-efficient design integrating advantages of batch immersion, single-wafer processing, and horizontal brush cleaning
wet-in/dry-out operation with robotic arm automatic wafer handling; optional open cassette or foup unloading configurations